Critical procedures and notes for high and low temperature test chambers

The harsh procedures of the high and low temperature test chamber mainly depend on the temperature level and duration of the test. The relevant standards should be selected from the following values:

1. Temperature: The high temperature of the high and low temperature test chambers are all at 150 degrees (if any special requirements can be customized to 180 degrees or higher, Shanghai Linpin Instrument Co., Ltd. Reminder: the refrigeration system of high and low temperature test chambers are usually placed in The bottom of the box, that is, the lower part of the working area. If a higher temperature is used in the working area, then for the refrigeration system below, it is undoubtedly doing a wear test, so our company does not recommend that the user put the extremely low and extremely high temperature. Realized in the same test area) The test temperature should be selected from the following values: -65, -55, -40, -25, -10, -5, +5 (the allowable deviation range of the test temperature is plus or minus 3 degrees) );

2. Duration: After the temperature of the test sample has stabilized, if a low-temperature test is required for a certain period of time, the duration should be selected from the following times: 2, 16, 72, 96H (if the purpose of the test is only to check Whether the test sample can work normally at low temperature, the test time is limited to the temperature of the test sample to achieve stability, but in any case, the duration should not be less than 30min, when this standard is used as the low temperature durability or reliability When contacting the relevant test, the duration required for the test is prescribed by the relevant standard).

Attachment: 1. The specific requirements that should be made when referring to this standard when using a low-temperature test chamber:

a. The rate of temperature change in the test chamber;

b. The time when the test sample is put into the test box;

c. The time when the test sample is exposed to the test under the test conditions;

d. The time when the test sample is electrified or charged

Attachment: 2. The relevant standards should provide the following applicable details for the low temperature test method:

a, pretreatment;

b. Initial inspection;

c. Details of installation or support;

d. The condition of the test samples (including cooling system) during the condition test;

e. Severe procedures (temperature and test duration);

f. Test and load during condition test;

g, recovery (if not under standard conditions);

h. Last test

I. Any changes to the test procedures agreed by both supply and demand.

Critical procedures and notes for high and low temperature test chambers

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